1
Motorola Small–Signal Transistors, FETs and Diodes Device Data
Dual General Purpose Transistors
The MBT3904DW1T1, MBT3906DW1T1, and MBT3946DW1T1 devices are
spin–offs of our popular SOT–23/SOT–323 three–leaded devices. They are designed
for general purpose amplifier applications and are housed in the SOT–363 six–leaded
surface mount package. By putting two discrete devices in one package, these
devices are ideal for low–power surface mount applications where board space is at
a premium.
hFE, 100–300
Low VCE(sat), 0.4 V
Simplifies Circuit Design
Reduces Board Space
Reduces Component Count
Available in 8 mm, 7–inch/3,000 Unit Tape and Reel
MAXIMUM RATINGS
Rating Symbol Value Unit
CollectorEmitter Voltage MBT3904DW1T1 (NPN)
MBT3906DW1T1 (PNP) VCEO 40
–40 Vdc
CollectorBase Voltage MBT3904DW1T1 (NPN)
MBT3906DW1T1 (PNP) VCBO 60
–40 Vdc
EmitterBase Voltage MBT3904DW1T1 (NPN)
MBT3906DW1T1 (PNP) VEBO 6.0
–5.0 Vdc
Collector Current — Continuous
MBT3904DW1T1 (NPN)
MBT3906DW1T1 (PNP)
IC200
–200
mAdc
THERMAL CHARACTERISTICS
Characteristic Symbol Max Unit
Total Package Dissipation(1)
TA = 25°CPD150 mW
Thermal Resistance Junction to Ambient R
q
JA 833 °C/W
Junction and Storage Temperature TJ, Tstg 55 to
+150 °C
1. Device mounted on FR4 glass epoxy printed circuit board using the minimum
1. recommended footprint.
DEVICE MARKING
MBT3904DW1T1 = MA MBT3946DW1T1 = 46
MBT3906DW1T1 = A2
Thermal Clad is a trademark of the Bergquist Company.
Order this document
by MBT3904DW1T1/D
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
MBT3904DW1T1
MBT3906DW1T1
MBT3946DW1T1
CASE 419B–01, STYLE 1
123
654
MBT3904DW1T1
MBT3906DW1T1
MBT3946DW1T1
Q1
(1)(2)
(3)
(4) (5) (6)
Q2
MBT3904DW1T1
Q1
(1)(2)
(3)
(4) (5) (6)
Q2
MBT3906DW1T1
Q1
(1)(2)
(3)
(4) (5) (6)
Q2
MBT3946DW1T1*
*Q1 same as MBT3906DW1T1
Q2 same as MBT3904DW1T1
Motorola, Inc. 1997
MBT3904DW1T1 MBT3906DW1T1 MBT3946DW1T1
2 Motorola Small–Signal Transistors, FETs and Diodes Device Data
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Characteristic Symbol Min Max Unit
OFF CHARACTERISTICS
CollectorEmitter Breakdown Voltage(2)
(IC = 1.0 mAdc, IB = 0) MBT3904DW1T1 (NPN)
(IC = –1.0 mAdc, IB = 0) MBT3906DW1T1 (PNP)
V(BR)CEO 40
–40
Vdc
CollectorBase Breakdown Voltage
(IC = 10
m
Adc, IE = 0) MBT3904DW1T1 (NPN)
(IC = –10
m
Adc, IE = 0) MBT3906DW1T1 (PNP)
V(BR)CBO 60
–40
Vdc
EmitterBase Breakdown Voltage
(IE = 10
m
Adc, IC = 0) MBT3904DW1T1 (NPN)
(IE = –10
m
Adc, IC = 0) MBT3906DW1T1 (PNP)
V(BR)EBO 6.0
–5.0
Vdc
Base Cutoff Current
(VCE = 30 Vdc, VEB = 3.0 Vdc) MBT3904DW1T1 (NPN)
(VCE = –30 Vdc, VEB = –3.0 Vdc) MBT3906DW1T1 (PNP)
IBL
50
–50
nAdc
Collector Cutoff Current
(VCE = 30 Vdc, VEB = 3.0 Vdc) MBT3904DW1T1 (NPN)
(VCE = –30 Vdc, VEB = –3.0 Vdc) MBT3906DW1T1 (PNP)
ICEX
50
–50
nAdc
ON CHARACTERISTICS (2)
DC Current Gain
(IC = 0.1 mAdc, VCE = 1.0 Vdc) MBT3904DW1T1 (NPN)
(IC = 1.0 mAdc, VCE = 1.0 Vdc)
(IC = 10 mAdc, VCE = 1.0 Vdc)
(IC = 50 mAdc, VCE = 1.0 Vdc)
(IC = 100 mAdc, VCE = 1.0 Vdc)
(IC = –0.1 mAdc, VCE = –1.0 Vdc) MBT3906DW1T1 (PNP)
(IC = –1.0 mAdc, VCE = –1.0 Vdc)
(IC = –10 mAdc, VCE = –1.0 Vdc)
(IC = –50 mAdc, VCE = –1.0 Vdc)
(IC = –100 mAdc, VCE = –1.0 Vdc)
hFE 40
70
100
60
30
60
80
100
60
30
300
300
CollectorEmitter Saturation V oltage
(IC = 10 mAdc, IB = 1.0 mAdc) MBT3904DW1T1 (NPN)
(IC = 50 mAdc, IB = 5.0 mAdc)
(IC = –10 mAdc, IB = –1.0 mAdc) MBT3906DW1T1 (PNP)
(IC = –50 mAdc, IB = –5.0 mAdc)
VCE(sat)
0.2
0.3
–0.25
–0.4
Vdc
BaseEmitter Saturation V oltage
(IC = 10 mAdc, IB = 1.0 mAdc) MBT3904DW1T1 (NPN)
(IC = 50 mAdc, IB = 5.0 mAdc)
(IC = –10 mAdc, IB = –1.0 mAdc) MBT3906DW1T1 (PNP)
(IC = –50 mAdc, IB = –5.0 mAdc)
VBE(sat) 0.65
–0.65
0.85
0.95
–0.85
–0.95
Vdc
SMALL–SIGNAL CHARACTERISTICS
CurrentGain — Bandwidth Product
(IC = 10 mAdc, VCE = 20 Vdc, f = 100 MHz) MBT3904DW1T1 (NPN)
(IC = –10 mAdc, VCE = –20 Vdc, f = 100 MHz) MBT3906DW1T1 (PNP)
fT300
250
MHz
Output Capacitance
(VCB = 5.0 Vdc, IE = 0, f = 1.0 MHz) MBT3904DW1T1 (NPN)
(VCB = –5.0 Vdc, IE = 0, f = 1.0 MHz) MBT3906DW1T1 (PNP)
Cobo
4.0
4.5
pF
Input Capacitance
(VEB = 0.5 Vdc, IC = 0, f = 1.0 MHz) MBT3904DW1T1 (NPN)
(VEB = –0.5 Vdc, IC = 0, f = 1.0 MHz) MBT3906DW1T1 (PNP)
Cibo
8.0
10.0
pF
2. Pulse Test: Pulse Width 300 µs; Duty Cycle 2.0%.
MBT3904DW1T1 MBT3906DW1T1 MBT3946DW1T1
3
Motorola Small–Signal Transistors, FETs and Diodes Device Data
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Continued)
Characteristic Symbol Min Max Unit
Input Impedance
(VCE = 10 Vdc, IC = 1.0 mAdc, f = 1.0 kHz) MBT3904DW1T1 (NPN)
(VCE = –10 Vdc, IC = –1.0 mAdc, f = 1.0 kHz) MBT3906DW1T1 (PNP)
hie 1.0
2.0 10
12
k
Voltage Feedback Ratio
(VCE = 10 Vdc, IC = 1.0 mAdc, f = 1.0 kHz) MBT3904DW1T1 (NPN)
(VCE = –10 Vdc, IC = –1.0 mAdc, f = 1.0 kHz) MBT3906DW1T1 (PNP)
hre 0.5
0.1 8.0
10
X 10–4
SmallSignal Current Gain
(VCE = 10 Vdc, IC = 1.0 mAdc, f = 1.0 kHz) MBT3904DW1T1 (NPN)
(VCE = –10 Vdc, IC = –1.0 mAdc, f = 1.0 kHz) MBT3906DW1T1 (PNP)
hfe 100
100 400
400
Output Admittance
(VCE = 10 Vdc, IC = 1.0 mAdc, f = 1.0 kHz) MBT3904DW1T1 (NPN)
(VCE = –10 Vdc, IC = –1.0 mAdc, f = 1.0 kHz) MBT3906DW1T1 (PNP)
hoe 1.0
3.0 40
60
m
mhos
Noise Figure
(VCE = 5.0 Vdc, IC = 100
m
Adc, RS = 1.0 k , f = 1.0 kHz) MBT3904DW1T1 (NPN)
(VCE = –5.0 Vdc, IC = –100
m
Adc, RS = 1.0 k , f = 1.0 kHz) MBT3906DW1T1 (PNP)
NF
5.0
4.0
dB
SWITCHING CHARACTERISTICS
Delay T ime (VCC = 3.0 Vdc, VBE = –0.5 Vdc) MBT3904DW1T1 (NPN)
(VCC = –3.0 Vdc, VBE = 0.5 Vdc) MBT3906DW1T1 (PNP) td
35
35
ns
Rise T ime (IC = 10 mAdc, IB1 = 1.0 mAdc) MBT3904DW1T1 (NPN)
(IC = –10 mAdc, IB1 = –1.0 mAdc) MBT3906DW1T1 (PNP) tr
35
35
ns
Storage T ime (VCC = 3.0 Vdc, IC = 10 mAdc) MBT3904DW1T1 (NPN)
(VCC = –3.0 Vdc, IC = –10 mAdc) MBT3906DW1T1 (PNP) ts
200
225
ns
Fall T ime (IB1 = IB2 = 1.0 mAdc) MBT3904DW1T1 (NPN)
(IB1 = IB2 = –1.0 mAdc) MBT3906DW1T1 (PNP) tf
50
75
ns
MBT3904DW1T1 MBT3906DW1T1 MBT3946DW1T1
4 Motorola Small–Signal Transistors, FETs and Diodes Device Data
MBT3904DW1T1 (NPN)
Figure 1. Delay and Rise Time
Equivalent Test Circuit Figure 2. Storage and Fall Time
Equivalent Test Circuit
+3
V
275
10 k
1N916 Cs < 4 pF*
+3
V
275
10 k
Cs < 4 pF*
< 1 ns
0.5 V
+10.9 V
300 ns
DUTY CYCLE = 2%
< 1 ns
9.1 V
+10.9 V
DUTY CYCLE = 2% t1
0
10 < t1 < 500
m
s
* Total shunt capacitance of test jig and connectors
TYPICAL TRANSIENT CHARACTERISTICS
Figure 3. Capacitance
REVERSE BIAS VOLTAGE (VOLTS)
2.0
3.0
5.0
7.0
10
1.00.1
Figure 4. Charge Data
IC, COLLECTOR CURRENT (mA)
5000
1.0
VCC = 40 V
IC/IB = 10
Q, CHARGE (pC)
3000
2000
1000
500
300
200
700
100
50
70
2.0 3.0 5.0 7.0 10 20 30 50 70 100 200
CAPACITANCE (pF)
1.0 2.0 3.0 5.0 7.0 10 20 30 40
0.2 0.3 0.5 0.7
QT
QA
Cibo
Cobo
TJ = 25°C
TJ = 125°C
MBT3904DW1T1 (NPN) MBT3904DW1T1 (NPN)
MBT3904DW1T1 MBT3906DW1T1 MBT3946DW1T1
5
Motorola Small–Signal Transistors, FETs and Diodes Device Data
MBT3904DW1T1 (NPN)
Figure 5. TurnOn Time
IC, COLLECTOR CURRENT (mA)
70
100
200
300
500
50
Figure 6. Rise Time
IC, COLLECTOR CURRENT (mA)
TIME
(
n
s)
1.0 2.0 3.0 10 20 70
5100
t , RISE TIME (ns)
Figure 7. Storage Time
IC, COLLECTOR CURRENT (mA)
Figure 8. Fall Time
IC, COLLECTOR CURRENT (mA)
5.0 7.0 30 50 200
10
30
7
20
70
100
200
300
500
50
1.0 2.0 3.0 10 20 70
5100
5.0 7.0 30 50 200
10
30
7
20
70
100
200
300
500
50
1.0 2.0 3.0 10 20 70
5100
5.0 7.0 30 50 200
10
30
7
20
70
100
200
300
500
50
1.0 2.0 3.0 10 20 70
5100
5.0 7.0 30 50 200
10
30
7
20
r
t , FALL TIME (ns)
f
t
,
S
TO
R
AGE TIME
(
n
s)
s
VCC = 40 V
IC/IB = 10
VCC = 40 V
IB1 = IB2
IC/IB = 20
IC/IB = 10
IC/IB = 10
tr @ VCC = 3.0 V
td @ VOB = 0 V
40 V
15 V
2.0 V
IC/IB = 10
IC/IB = 20
IC/IB = 10
IC/IB = 20 ts = ts1/8 tf
IB1 = IB2
MBT3904DW1T1 (NPN) MBT3904DW1T1 (NPN)
MBT3904DW1T1 (NPN) MBT3904DW1T1 (NPN)
TYPICAL AUDIO SMALL–SIGNAL CHARACTERISTICS
NOISE FIGURE VARIATIONS
(VCE = 5.0 Vdc, TA = 25°C, Bandwidth = 1.0 Hz)
Figure 9. Noise Figure
f, FREQUENCY (kHz)
4
6
8
10
12
2
0.1
Figure 10. Noise Figure
RS, SOURCE RESISTANCE (k OHMS)
0
N
F
,
N
OI
S
E FIGU
R
E
(d
B
)
1.0 2.0 4.0 10 20 40
0.2 0.4
0100
4
6
8
10
12
2
14
0.1 1.0 2.0 4.0 10 20 40
0.2 0.4 100
NF, NOISE FIGURE (dB)
f = 1.0 kHz IC = 1.0 mA
IC = 0.5 mA IC = 50
m
A
IC = 100
m
A
SOURCE RESISTANCE = 200
W
IC = 1.0 mA
SOURCE RESISTANCE = 200
W
IC = 0.5 mA
SOURCE RESISTANCE = 500
W
IC = 100
m
A
SOURCE RESISTANCE = 1.0 k
IC = 50
m
A
MBT3904DW1T1 (NPN) MBT3904DW1T1 (NPN)
MBT3904DW1T1 MBT3906DW1T1 MBT3946DW1T1
6 Motorola Small–Signal Transistors, FETs and Diodes Device Data
MBT3904DW1T1 (NPN)
h PARAMETERS
(VCE = 10 Vdc, f = 1.0 kHz, TA = 25°C)
Figure 11. Current Gain
IC, COLLECTOR CURRENT (mA)
70
100
200
3
00
50
Figure 12. Output Admittance
IC, COLLECTOR CURRENT (mA)
h
,
C
U
RR
E
N
T GAI
N
h , OUTPUT ADMITTANCE ( mhos)
Figure 13. Input Impedance
IC, COLLECTOR CURRENT (mA)
Figure 14. Voltage Feedback Ratio
IC, COLLECTOR CURRENT (mA)
30
1
00
50
5
10
20
2.0
3.0
5.0
7.0
10
1.0
0.1 0.2 1.0 2.0 5.0
0.5 10
0.3 0.5 3.0
0.7
2.0
5.0
10
20
1.0
0.2
0.5
oe
h , VOLTAGE FEEDBACK RATIO (x 10 )
re
h
,
I
NP
UT IM
P
EDA
NC
E
(
k OHM
S)
ie
0.1 0.2 1.0 2.0 5.0 10
0.3 0.5 3.0
0.1 0.2 1.0 2.0 5.0 10
0.3 0.5 3.0
2
1
0.1 0.2 1.0 2.0 5.0 10
0.3 0.5 3.0
fe
m
–4
MBT3904DW1T1 (NPN) MBT3904DW1T1 (NPN)
MBT3904DW1T1 (NPN) MBT3904DW1T1 (NPN)
MBT3904DW1T1 MBT3906DW1T1 MBT3946DW1T1
7
Motorola Small–Signal Transistors, FETs and Diodes Device Data
MBT3904DW1T1 (NPN)
TYPICAL STATIC CHARACTERISTICS
Figure 15. DC Current Gain
IC, COLLECTOR CURRENT (mA)
0.3
0.5
0.7
1.0
2.0
0.2
0.1
h , DC CURRENT GAIN (NORMALIZED)
0.5 2.0 3.0 10 50 70
0.2 0.3
0.1 100
1.00.7 200
30205.0 7.0
FE
VCE = 1.0 V
TJ = +125°C
+25°C
–55°C
MBT3904DW1T1 (NPN)
Figure 16. Collector Saturation Region
IB, BASE CURRENT (mA)
0.4
0.6
0.8
1.0
0.2
0.1
V , COLLECTOR EMITTER VOLTAGE (VOLTS)
0.5 2.0 3.0 100.2 0.3
01.00.7 5.0 7.0
CE
IC = 1.0 mA
TJ = 25°C
0.070.050.030.020.01
10 mA 30 mA 100 mA
MBT3904DW1T1 (NPN)
Figure 17. “ON” Voltages
IC, COLLECTOR CURRENT (mA)
0.4
0.6
0.8
1.0
1
.
2
0.2
Figure 18. Temperature Coefficients
IC, COLLECTOR CURRENT (mA)
V
,
VOLTAGE
(
VOLT
S)
1.0 2.0 5.0 10 20 50
0100
0.5
0
0.5
1
.0
0 60 80 120 140 160 180
20 40 100
COEFFICIENT (mV/ C)
200
1.0
1.5
2.0
200
°
TJ = 25°CVBE(sat) @ IC/IB =10
VCE(sat) @ IC/IB =10
VBE @ VCE =1.0 V
+25°C TO +125°C
–55°C TO +25°C
+25°C TO +125°C
–55°C TO +25°C
q
VC FOR VCE(sat)
q
VB FOR VBE(sat)
MBT3904DW1T1 (NPN) MBT3904DW1T1 (NPN)
MBT3904DW1T1 MBT3906DW1T1 MBT3946DW1T1
8 Motorola Small–Signal Transistors, FETs and Diodes Device Data
MBT3906DW1T1 (PNP)
Figure 19. Delay and Rise Time
Equivalent Test Circuit Figure 20. Storage and Fall Time
Equivalent Test Circuit
3 V
275
10 k
1N916 Cs < 4 pF*
3 V
275
10 k
Cs < 4 pF*
< 1 ns
+0.5 V
10.6 V 300 ns
DUTY CYCLE = 2%
< 1 ns
+9.1 V
10.9 V
DUTY CYCLE = 2% t1
0
10 < t1 < 500
m
s
* T otal shunt capacitance of test jig and connectors
TYPICAL TRANSIENT CHARACTERISTICS
Figure 21. Capacitance
REVERSE BIAS (VOLTS)
2.0
3.0
5.0
7.0
10
1.00.1
Figure 22. Charge Data
IC, COLLECTOR CURRENT (mA)
5000
1.0
VCC = 40 V
IC/IB = 10
Q, CHARGE (pC)
3000
2000
1000
500
300
200
700
100
50
70
2.0 3.0 5.0 7.0 10 20 30 50 70 100 200
CAPACITANCE (pF)
1.0 2.0 3.0 5.0 7.0 10 20 30 40
0.2 0.3 0.5 0.7
QTQA
Cibo
Cobo
TJ = 25°C
TJ = 125°C
MBT3906DW1T1 (PNP) MBT3906DW1T1 (PNP)
Figure 23. TurnOn Time
IC, COLLECTOR CURRENT (mA)
70
100
200
300
5
00
50
TIME
(
n
s)
1.0 2.0 3.0 10 20 70
5100
Figure 24. Fall Time
IC, COLLECTOR CURRENT (mA)
5.0 7.0 30 50 200
10
30
7
20
70
100
200
300
5
00
50
1.0 2.0 3.0 10 20 70
5100
5.0 7.0 30 50 200
10
30
7
20
t , FALL TIME (ns)
f
VCC = 40 V
IB1 = IB2
IC/IB = 20
IC/IB = 10
IC/IB = 10
tr @ VCC = 3.0 V
td @ VOB = 0 V
40 V
15 V
2.0 V
MBT3906DW1T1 (PNP) MBT3906DW1T1 (PNP)
MBT3904DW1T1 MBT3906DW1T1 MBT3946DW1T1
9
Motorola Small–Signal Transistors, FETs and Diodes Device Data
MBT3906DW1T1 (PNP)
TYPICAL AUDIO SMALL–SIGNAL CHARACTERISTICS
NOISE FIGURE VARIATIONS
(VCE = –5.0 Vdc, TA = 25°C, Bandwidth = 1.0 Hz)
Figure 25.
f, FREQUENCY (kHz)
2.0
3.0
4.0
5
.0
1.0
0.1
Figure 26.
Rg, SOURCE RESISTANCE (k OHMS)
0
N
F
,
N
OI
S
E FIGU
R
E
(d
B
)
1.0 2.0 4.0 10 20 40
0.2 0.4
0100
4
6
8
10
12
2
0.1 1.0 2.0 4.0 10 20 40
0.2 0.4 100
NF, NOISE FIGURE (dB)
f = 1.0 kHz IC = 1.0 mA
IC = 0.5 mA
IC = 50
m
A
IC = 100
m
A
SOURCE RESISTANCE = 200
W
IC = 1.0 mA
SOURCE RESISTANCE = 200
W
IC = 0.5 mA
SOURCE RESISTANCE = 2.0 k
IC = 100
m
A
SOURCE RESISTANCE = 2.0 k
IC = 50
m
A
MBT3906DW1T1 (PNP) MBT3906DW1T1 (PNP)
h PARAMETERS
(VCE = –10 Vdc, f = 1.0 kHz, TA = 25°C)
Figure 27. Current Gain
IC, COLLECTOR CURRENT (mA)
70
100
200
3
00
50
Figure 28. Output Admittance
IC, COLLECTOR CURRENT (mA)
h
,
D
C
C
U
RR
E
N
T GAI
N
h , OUTPUT ADMITTANCE ( mhos)
Figure 29. Input Impedance
IC, COLLECTOR CURRENT (mA)
Figure 30. Voltage Feedback Ratio
IC, COLLECTOR CURRENT (mA)
30
1
00
50
10
20
2.0
3.0
5.0
7.0
10
1.0
0.1 0.2 1.0 2.0 5.0
0.5 10
0.3 0.5 3.0
0.7
2.0
5.0
10
20
1.0
0.2
0.5
oe
h
,
I
NP
UT IM
P
EDA
NC
E
(
k OHM
S)
ie
0.1 0.2 1.0 2.0 5.0 10
0.3 0.5 3.0
0.1 0.2 1.0 2.0 5.0 10
0.3 0.5 3.0
7
5
0.1 0.2 1.0 2.0 5.0 10
0.3 0.5 3.0
fe
m
70
30
0.7 7.0
0.7 7.0
7.0
3.0
0.7
0.3
0.7 7.0
0.7 7.0
h , VOLTAGE FEEDBACK RATIO (x 10 )
re –4
MBT3906DW1T1 (PNP) MBT3906DW1T1 (PNP)
MBT3906DW1T1 (PNP) MBT3906DW1T1 (PNP)
MBT3904DW1T1 MBT3906DW1T1 MBT3946DW1T1
10 Motorola Small–Signal Transistors, FETs and Diodes Device Data
MBT3906DW1T1 (PNP)
TYPICAL STATIC CHARACTERISTICS
Figure 31. DC Current Gain
IC, COLLECTOR CURRENT (mA)
0.3
0.5
0.7
1.0
2.0
0.2
0.1
h , DC CURRENT GAIN (NORMALIZED)
0.5 2.0 3.0 10 50 70
0.2 0.3
0.1 100
1.00.7 200
30205.0 7.0
FE
VCE = 1.0 V
TJ = +125°C
+25°C
–55°C
MBT3906DW1T1 (PNP)
Figure 32. Collector Saturation Region
IB, BASE CURRENT (mA)
0.4
0.6
0.8
1.0
0.2
0.1
V , COLLECTOR EMITTER VOLTAGE (VOLTS)
0.5 2.0 3.0 100.2 0.3
01.00.7 5.0 7.0
CE
IC = 1.0 mA
TJ = 25°C
0.070.050.030.020.01
10 mA 30 mA 100 mA
MBT3906DW1T1 (PNP)
Figure 33. “ON” Voltages
IC, COLLECTOR CURRENT (mA)
0.4
0.6
0.8
1
.0
0.2
Figure 34. Temperature Coefficients
IC, COLLECTOR CURRENT (mA)
V
,
VOLTAGE
(
VOLT
S)
1.0 2.0 5.0 10 20 50
0100
0.5
0
0.5
1
.0
0 60 80 120 140 160 180
20 40 100 200
1.0
1.5
2.0
200
TJ = 25°C VBE(sat) @ IC/IB = 10
VCE(sat) @ IC/IB = 10
VBE @ VCE = 1.0 V +25°C TO +125°C
–55°C TO +25°C
+25°C TO +125°C
–55°C TO +25°C
q
VC FOR VCE(sat)
q
VB FOR VBE(sat)
, TEMPERATURE COEFFICIENTS (mV/ C)°
V
q
MBT3906DW1T1 (PNP) MBT3906DW1T1 (PNP)
MBT3904DW1T1 MBT3906DW1T1 MBT3946DW1T1
11
Motorola Small–Signal Transistors, FETs and Diodes Device Data
INFORMATION FOR USING THE SOT–363 SURFACE MOUNT PACKAGE
MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the total
design. The footprint for the semiconductor packages must
be the correct size to insure proper solder connection
interface between the board and the package. With the
correct pad geometry, the packages will self align when
subjected to a solder reflow process.
SOT–363
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
ÉÉÉ
0.5 mm (min)
0.4 mm (min)
0.65 mm 0.65 mm
1.9 mm
SOT–363 POWER DISSIPATION
The power dissipation of the SOT–363 is a function of the
pad size. This can vary from the minimum pad size for
soldering to a pad size given for maximum power dissipation.
Power dissipation for a surface mount device is determined
by TJ(max), the maximum rated junction temperature of the
die, RθJA, the thermal resistance from the device junction to
ambient, and the operating temperature, TA. Using the
values provided on the data sheet for the SOT–363 package,
PD can be calculated as follows:
PD = TJ(max) – TA
RθJA
The values for the equation are found in the maximum
ratings table on the data sheet. Substituting these values into
the equation for an ambient temperature T A of 25°C, one can
calculate the power dissipation of the device which in this
case is 150 milliwatts.
PD = 150°C – 25°C
833°C/W = 150 milliwatts
The 833°C/W for the SOT–363 package assumes the use
of the recommended footprint on a glass epoxy printed circuit
board to achieve a power dissipation of 150 milliwatts. There
are other alternatives to achieving higher power dissipation
from the SOT–363 package. Another alternative would be to
use a ceramic substrate or an aluminum core board such as
Thermal Clad. Using a board material such as Thermal
Clad, an aluminum core board, the power dissipation can be
doubled using the same footprint.
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated
temperature of the device. When the entire device is heated
to a high temperature, failure to complete soldering within a
short time could result in device failure. Therefore, the
following items should always be observed in order to
minimize the thermal stress to which the devices are
subjected.
Always preheat the device.
The delta temperature between the preheat and soldering
should be 100°C or less.*
When preheating and soldering, the temperature of the
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When
using infrared heating with the reflow soldering method,
the difference shall be a maximum of 10°C.
The soldering temperature and time shall not exceed
260°C for more than 10 seconds.
When shifting from preheating to soldering, the maximum
temperature gradient shall be 5°C or less.
After soldering has been completed, the device should be
allowed to cool naturally for at least three minutes.
Gradual cooling should be used as the use of forced
cooling will increase the temperature gradient and result
in latent failure due to mechanical stress.
Mechanical stress or shock should not be applied during
cooling.
* Soldering a device without preheating can cause excessive
thermal shock and stress which can result in damage to the
device.
MBT3904DW1T1 MBT3906DW1T1 MBT3946DW1T1
12 Motorola Small–Signal Transistors, FETs and Diodes Device Data
PACKAGE DIMENSIONS
CASE 419B-01
ISSUE C
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
DIM
AMIN MAX MIN MAX
MILLIMETERS
1.80 2.200.071 0.087
INCHES
B1.15 1.350.045 0.053
C0.80 1.100.031 0.043
D0.10 0.300.004 0.012
G0.65 BSC0.026 BSC
H––– 0.10–––0.004
J0.10 0.250.004 0.010
K0.10 0.300.004 0.012
N0.20 REF0.008 REF
S2.00 2.200.079 0.087
V0.30 0.400.012 0.016
STYLE 1:
PIN 1. EMITTER 2
2. BASE 2
3. COLLECTOR 1
4. EMITTER 1
5. BASE 1
6. COLLECTOR 2
B0.2 (0.008) MM
123
A
GV
S
H
C
N
J
K
654
–B–
D6 PL
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MBT3904DW1T1/D